This month we’ll be talking with Han Tran, Product Application Specialist for Fluke.   Registration is not required, anyone is welcome to attend.  Portable Power Quality Meters. Knowing the Fluke 435-II Power Quality and Energy Analyzer Meter:            What are its capabilities          How to use the meter          How to connect for three phase and single phase power systems          How to capture data          How do we download the information for preparing reports          How to analyze the captured data Han Tran has been an active employee within industrial groups for 11 years.  She has worked for Bently Nevada a General Electric company as an electrical engineer.  In this role, she has worked on embedded systems for Bently’s condition monitoring solutions.  She has also held a role as the Product Technical Owner managing the sustainment of Bently’s condition monitoring systems.  She changed jobs and companies in 2017 working as a Product Application Specialist for Fluke.  As a specialist, Han has been collaborating with end users to understand their pain points on the job and to develop solutions for these end users. Location: 701 Pike St Suite 1200 Seattle, Washington 98101

The IEEE Seattle Section Electromagnetic Compatibility (EMC) Society Chapter Antennas and Propagation (AP) Society, Microwave Theory and Techniques (MTT) Society, Electronic Devices (ED) Society Joint Chapter Communications Society (ComSoc) and Vehicular Technology (VT) Society Joint Chapter Proudly Present:  Advances in Antenna/EMC/Wireless Test and Measurement: A Colloquium and Exhibition With Special Keynote Speaker: Professor Yahya Rahmat-Samii - University of California, Los Angeles (UCLA)   The Program This program was designed to bring the latest information related to RF, EMC, and Antenna measurement techniques and standards to the local community.  Experts in the industry and academia will share practical information on various topics in an extended presentation format.  This allows a thorough discussion of each topic and provides the opportunity for extended questions and answers.  The “hands-on” quality of the presentation enables the registrant to learn useful information that can be used on the job – in the “real world.” ​See the Advance Program for a full list of abstracts and speaker bios   The Exhibition & Museum Tour There will be an exhibition by vendors of EMC, Wireless and Antenna test and measurement related products and services in the technical presentation area. These products and services address the needs of the commercial, military, and aerospace industries.   From 4:15 to 6:00 pm only, the Museum of Flight is open to everyone registered to attend this event.  Those wearing IEEE event badges only may take a complimentary self-guided tour of the museum galleries. Speaker(s): Yahya Rahmat-Samii, Location: Room: The Skyline Room, Second Floor Museum of Flight 9404 E Marginal Way S Seattle, Washington 98108